Engineering calculators
Reliability Engineering Toolkit
Plan demonstration tests, estimate semiconductor and system reliability, evaluate life data and compare accelerated exposures. Select a calculator, enter engineering inputs and review the model assumptions.
RDT Sample Size & Test Time
Calculate reliability demonstration test sample size or test time from field mission reliability, confidence, allowable failures and optional Weibull assumptions.
Open CalculatorFIT Rate & HTOL Confidence
Estimate observed and one-sided upper FIT from HTOL units, hours, failures, acceleration and confidence.
Open CalculatorDPPM / PPM Sample Size
Plan zero-defect sample sizes for a target defective-parts-per-million rate and confidence, or evaluate an observed zero-defect sample.
Open CalculatorArrhenius Acceleration Factor
Calculate Arrhenius thermal acceleration factor and equivalent field time from activation energy, field temperature and test temperature.
Open CalculatorWeibull Reliability & B-Life
Calculate Weibull reliability at time and B-life percentile from beta and characteristic life eta.
Open CalculatorWeibull Parameter Estimation
Fit a two-parameter Weibull distribution to exact failure times and right-censored observations using maximum likelihood.
Open CalculatorMTBF, MTTR & Availability
Calculate steady-state inherent availability, expected downtime, failure and repair rates from MTBF and MTTR.
Open CalculatorReliability Block Diagram
Calculate series, parallel and k-out-of-n mission reliability for independent, identical components.
Open CalculatorEyring Acceleration Factor
Calculate thermal Eyring acceleration and equivalent field time with a configurable temperature prefactor.
Open CalculatorInverse Power Law Acceleration Factor
Calculate inverse-power-law acceleration factor and equivalent exposure from field stress, test stress and exponent n.
Open CalculatorTemperature-Humidity Acceleration Factor
Calculate combined temperature and humidity acceleration with reciprocal-humidity or Peck models.
Open CalculatorTemperature-Nonthermal Acceleration Factor
Calculate combined Arrhenius and inverse power acceleration for temperature and a nonthermal stress.
Open CalculatorMTBF, FIT & Reliability
Convert MTBF or MTTF into reliability, failure probability, constant hazard rate and FIT under an exponential life model.
Open CalculatorCoffin-Manson Thermal Cycling Acceleration Factor
Estimate simplified thermal-cycle acceleration from field and test temperature ranges and a Coffin–Manson fatigue exponent.
Open CalculatorNorris-Landzberg Thermal Cycling Acceleration Factor
Calculate classical Norris-Landzberg cycle acceleration and equivalent field cycles from temperature excursion, maximum solder-joint temperature and cycling frequency.
Open CalculatorJunction Temperature & Thermal Resistance
Calculate device junction temperature, temperature rise and power or thermal-resistance limits from ambient temperature, dissipation and effective θJA.
Open CalculatorFMEA Risk Priority Number
Calculate and compare before-and-after FMEA risk priority numbers using severity, occurrence and detection ratings from 1 to 10.
Open CalculatorBlack’s Electromigration
Estimate current-density and temperature acceleration for interconnect electromigration using Black’s equation.
Open CalculatorEngineering context
Use a model supported by evidence.
Choose parameters that represent your population, mission profile and failure mechanism. Each page identifies its inputs, units and assumptions so the calculation can support reliability and qualification planning.
These calculations do not establish that a model is valid for a particular product. Confirm the stress range and failure mechanism before applying an acceleration factor or reliability prediction.
Explore Reliability EngineeringFurther reading