Original engineering guidance on selecting and applying established methods. The controlling specification and current revision define the requirements.
JESD47 is JEDEC’s stress test qualification standard for integrated circuits. SPACEREL helps chip designers, fabless semiconductor companies, start-ups and component users plan and manage JESD47 qualification across the UK and Europe.
We translate your requirements into a practical qualification programme, from initial assessment and test planning through laboratory coordination, results review, failure analysis and reporting.
Whether you are launching a new integrated circuit, responding to a customer specification or approaching a qualification deadline, we help establish the evidence you need and the work required to obtain it.
SPACEREL provides MIL-STD-883 testing, screening and qualification support for semiconductor devices and high-reliability microelectronics across the UK and Europe. We support chip designers, fabless companies, manufacturers and component users in defence, aerospace, space, medical, automotive and industrial sectors.
From test planning and specialist laboratory coordination to failure analysis and technical reporting, we help define and manage programmes tailored to your device and requirements. Send us your component details, applicable specification and target date to discuss your testing and qualification needs.
The IEC 60068 series provides environmental test methods and associated guidance. Selecting a test requires an understanding of the service environment, severity, duration, specimen configuration and performance measurements.
AEC-Q101 addresses stress-test qualification for discrete semiconductor devices in automotive applications. SPACEREL supports qualification-gap assessment, programme planning and review of test evidence against your device, package and intended use conditions.
The JESD22 family provides test methods used in semiconductor reliability and qualification programmes. Method selection, test conditions and acceptance criteria must be read with the applicable qualification specification and current method revision.
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MIL-STD-202 covers test methods used for electronic and electrical component assessment. Applicability depends on the part type and the governing requirement; it is not a universal qualification claim for an assembly or system.
ECSS standards can inform requirements for space engineering and product assurance, including parts, materials and processes. Project tailoring, contractual requirements and the mission context determine the applicable approach.
AEC-Q100 addresses stress-test qualification for integrated circuits used in automotive applications. An AEC qualification statement is specific evidence to review; it does not establish suitability for every mission or operating condition.
IPC standards address different aspects of electronic design, assembly, workmanship and acceptance. The particular document, product class and contractual requirement must be stated rather than referring to IPC compliance in general.
NASA EEE parts and reliability guidance can inform selection, screening, qualification and derating decisions. The controlling programme requirements and the current document revision determine how that guidance should be applied.
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Discuss the engineering challenge
A clear requirement is the first step.
Tell us about your electronic hardware, reliability or qualification requirements and the decisions you need to make. We'll help identify a practical engineering approach and the evidence needed to move forward.