Spacerel engineering
Standards & Methods
Original engineering guidance on selecting and applying established methods. The controlling specification and current revision define the requirements.
JEDEC JESD22
The JESD22 family provides test methods used in semiconductor reliability and qualification programmes. Method selection, test conditions and acceptance criteria must be read with the applicable qualification specification and current method revision.
Explore Integrated-circuit qualification frameworkJEDEC JESD47
JESD47 provides a qualification framework for integrated circuits. A programme needs to consider technology, package, change history and the evidence required by the applicable revision. Qualification coverage should be compared with the actual application.
Explore Microelectronic device test methodsMIL-STD-883
MIL-STD-883 brings together test methods for microelectronic devices. A method reference alone is insufficient: the selected conditions, sample requirements and controlling procurement or qualification requirements need to be identified.
Explore Electronic and electrical component methodsMIL-STD-202
MIL-STD-202 covers test methods used for electronic and electrical component assessment. Applicability depends on the part type and the governing requirement; it is not a universal qualification claim for an assembly or system.
Explore Environmental testingIEC 60068
The IEC 60068 series provides environmental test methods and associated guidance. Selecting a test requires an understanding of the service environment, severity, duration, specimen configuration and performance measurements.
Explore Space engineering and product assuranceECSS
ECSS standards can inform requirements for space engineering and product assurance, including parts, materials and processes. Project tailoring, contractual requirements and the mission context determine the applicable approach.
Explore Automotive integrated circuitsAEC-Q100
AEC-Q100 addresses stress-test qualification for integrated circuits used in automotive applications. An AEC qualification statement is specific evidence to review; it does not establish suitability for every mission or operating condition.
Explore Automotive discrete semiconductorsAEC-Q101
AEC-Q101 addresses stress-test qualification for discrete semiconductor devices in automotive applications. Device technology, package construction and use conditions remain important when reviewing evidence for another application.
Explore Electronic assembly and interconnectsIPC
IPC standards address different aspects of electronic design, assembly, workmanship and acceptance. The particular document, product class and contractual requirement must be stated rather than referring to IPC compliance in general.
Explore Parts selection and assuranceNASA EEE Guidance
NASA EEE parts and reliability guidance can inform selection, screening, qualification and derating decisions. The controlling programme requirements and the current document revision determine how that guidance should be applied.
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